SDL and MSC based test generation for distributed test architectures
نویسندگان
چکیده
Most of the SDL and MSC based test generation methods and tools produce non-concurrent TTCN test cases only. If the test equipment itself is a distributed system, the implementation of such test cases is a diicult task and requires a substantial amount of additional work. In this paper, we explain how concurrent TTCN test cases can be generated directly from SDL system speciications and MSC test purposes. To do this, explicit synchronization points have to be indicated in the MSC test purposes, and information about the existing test components and their connections has to be provided.
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تاریخ انتشار 1999